Photons with wavelength l = 1.4 A experience Compton scattering at an angle q = 60°. The scattered photons enter an X-ray spectrograph using the Bragg-Wulf interference reflection principle. At what minimum thickness of the spectrograph crystal plate can a change in the wavelength of scattered radiation (Compton shift) be detected in the first order, if the crystal lattice constant d = 1 A?

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